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Thin layer distinguishing and inspection is an important issue in the reflection seismology�� As there are thin layers or more complex formations underground��to eliminate the influences of some factors on the thin layer distinguishing��such as interior absorption of formation��we use the weighted integral spectrum on the basis of the integral energy spectrum��and prove through models that the weighted integral spectrum has better thin layer analysis effect than the unweighted integral energy spectrum�� At the same time��we combine the high-resolution complex trace analysis method��to prove the three instantaneous parameter of x' ( t) and function of d ( t) convolution having higher resolutions��